IEEE 1785.3:2016 pdf free download – IEEE Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above

02-15-2022 comment

IEEE 1785.3:2016 pdf free download – IEEE Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above
2. Normative references
The following referenced documents are indispensable for the application of this document(i.e., they mustbe understood and used, so cach referenced document is cited in text and its relationship to this document isexplained).For dated refcrences, only the edition cited applies.For undated references, the latest edition of thereferenced document (including any amendments or corrigenda) applies.
IEEE Std 1785.1TM-2012,IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces forFrequencies of 110GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions.*.5
IEEE Std 1785.2TM-2016,IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces forFrequencics of 110 GHz and Above——Part 2: Waveguide Interfaces.
3. Requirements
3.1 General requirements
IEEE Std 1785.1-2012 and IEEE Std 1785.2-2016 specify tolerances that improve both the mechanical com-patibility of rectangular-waveguide interfaces and the electrical performance.However,JCGM 100:2008[B1]Jrecommends that end users estimate as accurately as possible the actual uncertainties in the measurementsthey perform.In some cases, the precision of the apertures and interfaces machined by a given manufacturerwill exceed the tolerances specified in IEEE Std 1785.1-2012 and IEEE Std 1785.2-2016.In addition, it is notpossible to determine the probability distributions of those dimensions from the tolerances specified in IEEEstd 1785.1-2012 and IEEE Std 1785.2-2016 that JCGM 100:2008[Bl] recommends that end users consider intheir uncertainty analyses.This recommended practice provides recommendations that facilitate the commu-nication of the mechanical dimensions of rectangular-waveguide apertures and interfaces actually deliveredto the end user by the manufacturer or test laboratory with their uncertainties. These recommendations arespecifically designed to provide end users with the information compiled by the manufacturer or test laborato-ry.End users should follow recommendations from JCGM 100:2008 [Bl] to calculate the uncertainty of bothreflection and transmission coefficients through interfaces provided by different vendors.
The uncertainty distributions for the tabulated data should also be specified.The tabulated information should,at a minimum, provide for the specification of standard and truncated Gaussian, rectangular, and Bernoulli(binary) distributions and a distribution should be assigned to each uncertainty mechanism. To accommodatestandard and truncated Gaussian distributions, the manufacturer or test laboratory should also specify distribu-tion limits in addition to the standard uncertainty of the distribution. The entry of a standard uncertainty is notrequired to specify rectangular and Bernoulli distributions.
Worst-case specifications or tolerances should be specified with distributions that limit the value of a parameterto a specified range.Examples are the rectangular, arc-sine, Bernoulli, and truncated Gaussian distributions.lt should be made clear that a radius, not a diameter, is being used to specify geometric tolerance zones.Themanner in which the calculations are performed should be explained clearly.
Repeated measurements of the reflection coefficient of a load made using a calibrated reflectometer(e.g, avector network analyzer) should be provided for purposes of comparison when data is available ( Li, et al[B11], Horibe and Noda [B8], and Horibe and Kishikawa [B6]).
3.3 Uncertainty calculations
Uncertainty calculations should adhere to the recommendations and practices given in JCGM 100:2008[Bl] and JCGM 101:2008 [B2]. The uncertainty due to the shunt susceptance caused by the interconnec-tion of two rectangular-waveguide interfaces has a roughly quadratic dependence on the lateral off-set between the interfaces and can dominate other sources of uncertainty at submillimeter-wave and tera-hertz frequencies (Williams [B15]). Thus,the calculations should be capable of correctly propagatingrectangular-waveguide uncertainties ([B15],Hunter[B9],Marcuvitz [Bi2],Anson,et ai [B3],Brady[B5], Kerr, et al [B10],Bannister, et al [B4], Oleson and Denning [Bl3], Ridler, et al [B14] and Horibe,et al [B7) in the presence of nonlinear error mechanisms and calculating any statistical bias in the results.

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