ANSI ESD STM 5.5.1:2016 pdf free download – For Electrostatic Discharge Sensitivity Testing
1.2 Scope
The scope and focus of this document pertains to TLP testing techniques of semiconductor components. The focus of the document is on quasi-static application of TLP testing techniques, however the techniques can also be applied to study transient behavior of semiconductor components.
1.3 Application
The term VF-TLP is used for very short pulses (S 10 ns), consistent with the definition of this term in this document, and standard TLP for longer pulses (10 ns < pulse duration S 200 ns). The term long pulse TLP is used when discussing pulses longer than 200 ns pulse length and where special considerations need to be taken into account due to the long pulse length. To indicate a TLP setup with a specific pulse duration we will use terminology like 100 ns-TLP (for TLP using 100 ns pulses); 1 ns-TLP (for TLP using 1 ns pulses), etc. Therefore, previous versions of ANSI/ESD STM5.5.1 (2014 and older) typically dealt with 100 ns-TLP, while ANSI/ESD SP5.5.2 (VF-TLP) dealt with TLP systems ranging from 1 ns-TLP to 10 ns-TLP. The requirements for the equipment and procedures described in this document have been demonstrated to produce repeatable results for quasi-static TLP on different structures in different labs. The results were published in ESD TR5.5-02-08 and ESD TR5.5-03-14. For specific applications and/or practical reasons useful results may be achieved with parts of the equipment not fully meeting these requirements. If such results are reported, the limitations of the equipment used need to be documented and the results will not be compliant with this STM.
5.0 EQUIPMENT TLP
systems vary in their use of equipment, configurations, and methodology to extract the current and voltage characteristics of a device. TLP design and system configurations are contained in Annex A. Most TLP systems have a cable impedance of 50 ohms and that impedance is often assumed in this document. If working with a system with cable impedances other than 50 ohms, load conditions specified as 50 ohms shall be changed to match the impedance of the system being used. The sections below specify the minimum bandwidth requirements for measurement equipment in a TLP system. These requirements are sufficient for quasi-static TLP，i.e. for accurate measurements in a window after the initial transient effects have settled. Higher bandwidths can be used to obtain more detailed information in the waveforms. VF-TLP systems must achieve a minimum system bandwidth to achieve time resolved measurements of the DUT. System bandwidth will be limited by the lowest bandwidth component. The minimum requirements stated in Section 5.0 may limit total bandwidth. No element in the signal path, such as attenuators, cables and switches, shall limit the bandwidth below that of the measurement equipment. All equipment within the test system shall be able to withstand the maximum current for the largest pulse width applied. Additionally, all equipment shall withstand the maximum voltage from the initial pre-charge voltage (including the reflected voltage) observed in the test system. Current and voltage probes shall not saturate and/or fail during TLP testing.